Where performance meets flexibility - benefit from the widest range of accessories in the market

Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.


3D print option

Free add-on for all JPK users: Create three-dimensional objects out of AFM images.


Remote control and monitoring of complex and long-term experiments.

QI™ Advanced mode

The QI™-Advanced option delivers parameters like adhesion, stiffness, dissipation and more while scanning.


For comprehensive planning of an experiment with all of the external parameters.

Advanced Force Spectroscopy module

For advanced force measurement experiments from single protein unfolding, DNA stretching to probing of cells and tissue.

DirectOverlay™ software module

Perfect integration of optical and AFM data – JPK‘s proprietary and patented solution for perfect overlay of optical and AFM information.

NanoLithography/NanoManipulation module

Software module for NanoWizard® systems.

MicroRheology software module

For visco-elastic properties of living cells and other samples such as gels or foams.