Where performance meets flexibility - benefit from the widest range of accessories in the market

Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.

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HyperDrive™ fluid imaging package

For highest resolution imaging of soft samples in air and liquid

CoverslipHolder with electrical sample connection

For electrical measurements such as Conductive AFM or STM on a coverslip in combination with high NA optics

Electrical sample connection module

Accommodates electrical conductive samples such as AFM metal stubs by magnetic fixation or transparent samples such as ITO coated glass coverslips.

Kelvin Probe Microscopy (KPM) module

Option for nanoscale mapping of surface potential distribution

Conductive AFM (CAFM) module

For high-performance conductivity experiments

Conductive AFM module - enclosed volume

For high-performance conductivity experiments under controlled environmental conditions

TC-CAFM module

For low-conducting samples

Scanning Tunneling Microscopy (STM) module

Tip-bias wire holder with integrated current amplifier circuit and automatic samp-le grounding

High Voltage Sample Bias Amplifier

For biasing a sample, e.g., in electro-optical experiments or in Piezoresponse Force Microscopy (PFM) and piezo hysteresis mapping

ForceWheel

For most sensitive experiment control, e.g. force fishing experiments

Tuning Fork module

For tuning fork-based feedback modes e.g. fiber-SNOM or TERS

FluidicsModule™

JPK FluidicsModule™ with up to 8 different liquids such as buffer solutions

Scanning Thermal Microscopy module - SThM

From Bruker Anasys, for thermal conductivity experiments