DirectOverlay™ 2 software module

Perfect optical integration enables direct correlation of AFM and optical data

  • Perfect overlay of optical and AFM data with sub-diffraction limit precision
  • Direct “in optical image” selection of AFM measurements (imaging and force curves)
  • Dramatic reduction of overview image scanning in AFM, giving faster results & lower tip contamination
  • Optical image navigation to specific regions of interest, even without AFM scanning. This protects functionalized tips for molecular recognition, avoids tip passivation from image scanning before the force measurements.


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