Where performance meets flexibility - benefit from the widest range of accessories in the market

Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. JPK provides you with the right accessories to control your sample conditions and to perform successful experiments.

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The JPK HybridStage™

Automated mapping of sample properties over a large area from millimeters to nanometers and with picoNewton force resolution.

Vortis™ A Combi controller

One system for all nano-force applications: The combined high-end solution for JPK Scanning Probe Microscopes and Optical Tweezers systems.

Vortis™ A SPMControl station

  • State-of-the-art digital controller with lowest noise levels.
  • High speed 16bit AD conversion with 60 MHz for the photodetector signals
  • 24bit ultra precise ADC with 2.5 MHz

Vortis™ A Advanced SPMControl station

  • State-of-the-art digital controller with lowest noise levels.
  • 4 high speed 16bit ADC channels with 60 MHz
  • 12 ADCs with 18bit with 800 kHz